NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/19349

Title: Metrology for the Micro-Arcsecond Metrology Testbed
Authors: Kuhnert, A.
Shaklan, S.
Gursel, Y.
Azevedo, S.
Lin, Y.
Issue Date: 19-Mar-1998
Citation: SPIE, Astronomical Telescopes
Kona, Hawaii, USA
Abstract: The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths.
URI: http://hdl.handle.net/2014/19349
Appears in Collections:JPL TRS 1992+

Files in This Item:

File SizeFormat
98-0679.pdf863.4 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.

 

Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on December 5, 2014.
If you have any comments or suggestions for this web site, please e-mail Robert Powers.