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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/19349
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| Title: | Metrology for the Micro-Arcsecond Metrology Testbed |
| Authors: | Kuhnert, A.
Shaklan, S.
Gursel, Y.
Azevedo, S.
Lin, Y. |
| Issue Date: | 19-Mar-1998 |
| Citation: | SPIE, Astronomical Telescopes
Kona, Hawaii, USA |
| Abstract: | The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths. |
| URI: | http://hdl.handle.net/2014/19349 |
| Appears in Collections: | JPL TRS 1992+
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