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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/18942
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| Title: | Ballistics-Electron-Microscopy and Spectroscopy of Metal/GaN Interfaces |
| Authors: | Bell, L. D.
Smith, R. P.
McDermott, B. T.
Gertner, E. R.
Pittman, R.
Pierson, R. L.
Sullivan, G. J. |
| Issue Date: | Dec-1997 |
| Citation: | Applied Physics Letters
USA |
| Abstract: | BEEM spectroscopy and imaging have been applied to the Au/GaN interface. In contrast to previous BEEM measurements, spectra yield a Schottky barrier height of 1.04eV that agrees well with the highest values measured by conventional methods. |
| URI: | http://hdl.handle.net/2014/18942 |
| Appears in Collections: | JPL TRS 1992+
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