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|Title: ||Ballistics-Electron-Microscopy and Spectroscopy of Metal/GaN Interfaces|
|Authors: ||Bell, L. D.|
Smith, R. P.
McDermott, B. T.
Gertner, E. R.
Pierson, R. L.
Sullivan, G. J.
|Issue Date: ||Dec-1997 |
|Citation: ||Applied Physics Letters|
|Abstract: ||BEEM spectroscopy and imaging have been applied to the Au/GaN interface. In contrast to previous BEEM measurements, spectra yield a Schottky barrier height of 1.04eV that agrees well with the highest values measured by conventional methods.|
|Appears in Collections:||JPL TRS 1992+|
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