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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/18942

Title: Ballistics-Electron-Microscopy and Spectroscopy of Metal/GaN Interfaces
Authors: Bell, L. D.
Smith, R. P.
McDermott, B. T.
Gertner, E. R.
Pittman, R.
Pierson, R. L.
Sullivan, G. J.
Issue Date: Dec-1997
Citation: Applied Physics Letters
USA
Abstract: BEEM spectroscopy and imaging have been applied to the Au/GaN interface. In contrast to previous BEEM measurements, spectra yield a Schottky barrier height of 1.04eV that agrees well with the highest values measured by conventional methods.
URI: http://hdl.handle.net/2014/18942
Appears in Collections:JPL TRS 1992+

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