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Title: Effects of Humidity on Non-Hermetically Packaged III-V Structures and Devices
Authors: Leon, R.
Martin, S.
Lee, T.
Okuno, J.
Ruiz, R.
Gauldin, R.
Gaidis, M.
Smith, R.
Issue Date: 26-Oct-1999
Citation: 2nd Annual Microelectronics Reliability and Qualification
Pasadena, CA, USA
Abstract: High humidity and temperature test (known as 85/85 tests) were performed on various III-V devices and structures to determine environmental effects in non-hermetically packaged GaAs membrane mixer diodes.
Appears in Collections:JPL TRS 1992+

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