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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/18426
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| Title: | Effects of Humidity on Non-Hermetically Packaged III-V Structures and Devices |
| Authors: | Leon, R.
Martin, S.
Lee, T.
Okuno, J.
Ruiz, R.
Gauldin, R.
Gaidis, M.
Smith, R. |
| Issue Date: | 26-Oct-1999 |
| Citation: | 2nd Annual Microelectronics Reliability and Qualification
Pasadena, CA, USA |
| Abstract: | High humidity and temperature test (known as 85/85 tests) were performed on various III-V devices and structures to determine environmental effects in non-hermetically packaged GaAs membrane mixer diodes. |
| URI: | http://hdl.handle.net/2014/18426 |
| Appears in Collections: | JPL TRS 1992+
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