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Title: On-Wafer Testing of Circuits Through 220 GHz
Authors: Gaier, T.
Samoska, L.
Oleson, C.
Boll, G.
Issue Date: 15-Apr-1999
Citation: Ultrafast Electronics and Optics
Abstract: We have jointly developed the capability to perform on-wafer s-parameter and noise figure measurements through 220 GHz.
Appears in Collections:JPL TRS 1992+

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