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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/17611
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| Title: | On-Wafer Testing of Circuits Through 220 GHz |
| Authors: | Gaier, T.
Samoska, L.
Oleson, C.
Boll, G. |
| Issue Date: | 15-Apr-1999 |
| Citation: | Ultrafast Electronics and Optics
USA |
| Abstract: | We have jointly developed the capability to perform on-wafer s-parameter and noise figure measurements through 220 GHz. |
| URI: | http://hdl.handle.net/2014/17611 |
| Appears in Collections: | JPL TRS 1992+
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