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Title: Target Calibration: Retro-Reflection Mechnisms at 2 Microns
Authors: Tratt, D.
Haner, D.
Issue Date: 28-Jun-1999
Citation: 10th Coherent Laser Radar Conference
Mt. Hood, Oregon, U.S.A.
Abstract: There is increased interest in the reflectance properties of hard target calibration materials at this wavelength.
Appears in Collections:JPL TRS 1992+

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