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|Title: ||Target Calibration: Retro-Reflection Mechnisms at 2 Microns|
|Authors: ||Tratt, D.|
|Issue Date: ||28-Jun-1999 |
|Citation: ||10th Coherent Laser Radar Conference|
Mt. Hood, Oregon, U.S.A.
|Abstract: ||There is increased interest in the reflectance properties of hard target calibration materials at this wavelength.|
|Appears in Collections:||JPL TRS 1992+|
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