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Title: BEAM: technology for autonomous self-analysis
Authors: Mackey, R.
James, M.
Park, H.
Zak, M.
Issue Date: 7-Nov-2000
Citation: IEEE Aerospace Conference
Big Sky, Montana, USA
Abstract: BEAM is an end-to-end method of data analysis intended for real-time fault detection and characterization.
Appears in Collections:JPL TRS 1992+

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