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Title: Extreme thermal environmental tests of plastic encapsulated cots
Authors: Kim, Q.
Okuno, J. O.
Evans, K. C.
Knudson, D.
Mih, D. T.
Gerke, R. D.
Sandor, M. A.
Issue Date: 17-Aug-2000
Citation: 3rd Annual IEEE Microelctronics Reliability and Qualification Workshop
Glendale, California, USA
Appears in Collections:JPL TRS 1992+

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