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JPL TRS 1992+ >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/15929
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| Title: | Extreme thermal environmental tests of plastic encapsulated cots |
| Authors: | Kim, Q.
Okuno, J. O.
Evans, K. C.
Knudson, D.
Mih, D. T.
Gerke, R. D.
Sandor, M. A. |
| Issue Date: | 17-Aug-2000 |
| Citation: | 3rd Annual IEEE Microelctronics Reliability and Qualification Workshop
Glendale, California, USA |
| URI: | http://hdl.handle.net/2014/15929 |
| Appears in Collections: | JPL TRS 1992+
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