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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/15901
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| Title: | Ballistic-electron-emission microscopy of device materials and structures |
| Authors: | Bell, L. D. |
| Issue Date: | 9-Aug-2000 |
| Citation: | University of Madrid Summer School on Imaging and Manipulation of Matter at the Nanometer Scale
Madrid, Spain |
| URI: | http://hdl.handle.net/2014/15901 |
| Appears in Collections: | JPL TRS 1992+
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