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JPL TRS 1992+ >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/12919
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| Title: | Packaging and reliability of electronic nose for space applications |
| Authors: | Ramesham, R.
Young, R.
Graf, J.
Ryan, A. |
| Issue Date: | 7-Jun-2001 |
| Citation: | Assurance Technology Conference
Cleveland, Ohio, USA |
| URI: | http://hdl.handle.net/2014/12919 |
| Appears in Collections: | JPL TRS 1992+
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