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|Title: ||Heavy ion induced soft breakdown of thin gate oxides|
|Authors: ||Conley, J. F.|
Suehle, J. S.
Johnston, A. H.
Vogel, E. M.
|Issue Date: ||27-Mar-2001 |
|Citation: ||Nuclear and Space Radiation Effects Conference 2001|
|Abstract: ||Heavy ion induced soft and hard breakdown are investigated in thin gate oxides as a function of LET, fluence, and voltage applied during irradiation. It is found that post-irradiation oxide conduction is well described by the Sune quantum point contact model.|
|Appears in Collections:||JPL TRS 1992+|
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