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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/12580

Title: Heavy ion induced soft breakdown of thin gate oxides
Authors: Conley, J. F.
Suehle, J. S.
Johnston, A. H.
Wang, B.
Miyahara, T.
Vogel, E. M.
Issue Date: 27-Mar-2001
Citation: Nuclear and Space Radiation Effects Conference 2001
Vancouver, Canada
Abstract: Heavy ion induced soft and hard breakdown are investigated in thin gate oxides as a function of LET, fluence, and voltage applied during irradiation. It is found that post-irradiation oxide conduction is well described by the Sune quantum point contact model.
URI: http://hdl.handle.net/2014/12580
Appears in Collections:JPL TRS 1992+

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