NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item:

Title: Heavy ion induced soft breakdown of thin gate oxides
Authors: Conley, J. F.
Suehle, J. S.
Johnston, A. H.
Wang, B.
Miyahara, T.
Vogel, E. M.
Issue Date: 27-Mar-2001
Citation: Nuclear and Space Radiation Effects Conference 2001
Vancouver, Canada
Abstract: Heavy ion induced soft and hard breakdown are investigated in thin gate oxides as a function of LET, fluence, and voltage applied during irradiation. It is found that post-irradiation oxide conduction is well described by the Sune quantum point contact model.
Appears in Collections:JPL TRS 1992+

Files in This Item:

File SizeFormat
01-0808.pdf720.24 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.


Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on December 5, 2014.
If you have any comments or suggestions for this web site, please e-mail Robert Powers.