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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/12143

Title: Narrow band emission from lithographically defined photonic bandgap structures in silicon: matching theory and experiment
Authors: Greenwald, A. C.
Daly, J. T.
Johnson, E. A.
Kinkade, B.
McNeal, M.
Pralle, M.
Moelders, N.
George, T.
Choi, D. S.
Biswas, R.
El-Kady, I.
Issue Date: 27-Nov-2001
Citation: MRS Fall Meeting
Abstract: The authors previously reported discovery of narrow, thermal emission bands from symmetrically patterned features etched into silicon wafers. In this paper, we report further results that show the measured absorption peaks for such patterned surfaces match theoretical calculations of the complete electrodynamic problem solved using the Transfer Matrix Method (TMM).
URI: http://hdl.handle.net/2014/12143
Appears in Collections:JPL TRS 1992+

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