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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/12119
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| Title: | Backside device irradiation for single event upset tests of advanced devices |
| Authors: | Swift, G. M. |
| Issue Date: | 25-Apr-2002 |
| Citation: | SEE Symposium
Manhattan Beach, CA, USA |
| URI: | http://hdl.handle.net/2014/12119 |
| Appears in Collections: | JPL TRS 1992+
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