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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/12119

Title: Backside device irradiation for single event upset tests of advanced devices
Authors: Swift, G. M.
Issue Date: 25-Apr-2002
Citation: SEE Symposium
Manhattan Beach, CA, USA
URI: http://hdl.handle.net/2014/12119
Appears in Collections:JPL TRS 1992+

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