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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/10618
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| Title: | Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices |
| Authors: | Gallegos, M.
Leon, R.
Vu, D. T.
Okuno, J.
Johnson, A. S. |
| Issue Date: | 10-Oct-2002 |
| Citation: | IEEE International Integrated Reliability Workshop
Fallen Leaf Lake, CA, USA |
| Abstract: | Accelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained. |
| URI: | http://hdl.handle.net/2014/10618 |
| Appears in Collections: | JPL TRS 1992+
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