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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/10618

Title: Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices
Authors: Gallegos, M.
Leon, R.
Vu, D. T.
Okuno, J.
Johnson, A. S.
Issue Date: 10-Oct-2002
Citation: IEEE International Integrated Reliability Workshop
Fallen Leaf Lake, CA, USA
Abstract: Accelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained.
URI: http://hdl.handle.net/2014/10618
Appears in Collections:JPL TRS 1992+

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