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|Title: ||Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices|
|Authors: ||Gallegos, M.|
Vu, D. T.
Johnson, A. S.
|Issue Date: ||10-Oct-2002 |
|Citation: ||IEEE International Integrated Reliability Workshop|
Fallen Leaf Lake, CA, USA
|Abstract: ||Accelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained.|
|Appears in Collections:||JPL TRS 1992+|
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