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Title: Quantitative software models for the estimation of cost, size, and defects
Authors: Hihn, J.
Bright, L.
Decker, B.
Lum, K.
Mikulski, C.
Powell, J.
Issue Date: 4-Nov-2002
Citation: 2nd Annual JPL IT Symposium
Pasadena, CA, USA
Abstract: The presentation will provide a brief overview of the SQI measurement program as well as describe each of these models and how they are currently being used in supporting JPL project, task and software managers to estimate and plan future software systems and subsystems.
Appears in Collections:JPL TRS 1992+

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