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BEACON eSpace at Jet Propulsion Laboratory >
Browsing by Date
Showing items 1-21 of 21835.
| Issue Date | Title | Author(s) |
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Multiple-spacecraft reconfigurations through collision avoidance, bouncing, and stalemate |
Kim, Y.; Mesbahi, M.; Hadaegh, F. Y. |
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NASA’s Spitzer Space Telescopes's operational mission experience |
Wilson, Robert K.; Scott, Charles P. |
| 26-Jul-2206 |
Cassini thermal observations of Saturn’s main rings : Implications for particle rotation and vertical mixing |
Spilkera, Linda J.; Pilorz, Stuart H.; Wallis, Brad D.; Pearl, John C.; Cuzzi, Jeffrey N.; Brooks, Shawn M.; Altobelli, Nicolas; Edgington, Scott G.; Showalter, Mark; Flasar, F. Michael; Ferrari, Cecile; Leyrat, Cedric |
| Jun-2008 |
IR DirectFET extreme environments evaluation final report |
Burmeister, Martin; Mottiwala, Amin |
| Jun-2008 |
FPGA insertion guideline |
Sheldon, Douglas |
| May-2008 |
Radiation effects assessment of MRAM devices |
Elghefari, Mohamed; McClure, Steve |
| May-2008 |
Scaled CMOS technology reliability users guide |
White, Mark; Chen, Yuan |
| Apr-2008 |
Commercial sensory survey radiation testing progress report |
Becker, Heidi N.; Dolphic, Michael D.; Thorbourn, Dennis O.; Alexander, James W.; Salomon, Phil M. |
| Apr-2008 |
QuikSCAT follow - on concept study |
Gaston, Robert W.; Rodriquez, Ernesto |
| Apr-2008 |
Guideline for ground radiation testing of microprocessors in the space radiation environment |
Irom, Farokh |
| Apr-2008 |
TID effects in space-like variable dose rates |
Harris, Richard D. |
| Apr-2008 |
VIRTEX - 4 VQ static SEU characterization summary |
Allen, Gregory; Swift, Gary; Carmichael, Carl |
| Apr-2008 |
The impact of hydrogen contamination on the Total Dose Response of Linear Bipolar Microcircuits |
Adell, Philippe C.; McClure, Steve S. |
| Mar-2008 |
Effects of hand soldering MIL-PRF 55365 tantalum capacitors |
Reed, Erik K.; Spence, Penelope L.; Sheldon, Douglas |
| Mar-2008 |
Disturb testing in flash memories |
Sheldon, Douglas; Freie, Michael |
| Feb-2008 |
Commercial sensor survey status report |
Becker, Heidi N.; Alexander, James W.; Thorbourn, Dennis O.; Konefat, Edward H. |
| Feb-2008 |
Microelectronics reliability : physics-of-failure based modeling and lifetime evaluation |
White, Mark |
| Feb-2008 |
Testing guideline for single event gate rupture (SEGR) of power MOSFETs |
Scheick, Leif |
| Feb-2008 |
Assessing and mitigating radiation effects in Xilinx FPGAs |
Adell, Philippe; Allen, Greg |
| Feb-2008 |
The experimental probe of inflationary cosmology : a mission concept study for NASA’s Einstein Inflation Probe |
Alex Amblard; Beichman, Charles; Bock, James; Caldwell, Robert; Carlstrom, John; Church, Sarah; Cooray, Asantha; Dickenson, Clive; Dodelson, Scott; Dowell, Darren; Dragovan, Mark; Gaier, Todd; Ganga, Ken; Gear, Walter; Glenn, Jason; Golwala, Sunil; Gorski, Krzysztof; Hanany, Shaul; Heiles, Carl; Hivon, Eric; Holzapfel, Bill; Irwin, Kent; Jewell, Jeff; Kaplinghat, Manoj; Knox, Lloyd; Lee, Adrian; Lange, Andrew; Lawrence, Charles; Leitch, Erik; Levin, Steven; Matsumura, Tomotake |
| 15-Jan-2008 |
SiC vs Si for high radiation environments : NASA electronic parts and packaging (NEPP) program Office of Safety and Mission Assurance. |
Harris, Richard D. |
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