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Issue DateTitleAuthor(s)
Multiple-spacecraft reconfigurations through collision avoidance, bouncing, and stalemate Kim, Y.; Mesbahi, M.; Hadaegh, F. Y.
NASA’s Spitzer Space Telescopes's operational mission experience Wilson, Robert K.; Scott, Charles P.
Rest architecture for link analysis tools portal Cheung, Kar-Ming; Lee, Charles; Lee, Carlyn-­‐Ann
Radar waveform pulse analysis measurement system for high-power GaN amplifiers Thrivikraman, Tushar; Perkovic-Martin, Dragana; Jenabi, Masud; Hoffman, James
4-Aug-2014 Human missions to Mars orbit, phobos, and Mars surface using 100-kWe-class solar electric propulsion Price, Humphrey W.; Woolley, Ryan C.; Strange, Nathan J.; Baker, John D.
4-Aug-2014 Human missions to Mars orbit, Phobos, and Mars surface using 100-kWe-class solar electric propulsion Price, Hoppy; Baker, John; Strange, Nathan; Woolley, Ryan
17-Apr-2014 AE (Acoustic Emission) for Flip-Chip CGA/FCBGA defect detection Ghaffarian, Reza
17-Mar-2014 Spot: a programming language emphasizing safety Gostelow, Kim; Bocchino, Robert L. Jr.; Gamble, Ed; Som, Raft
5-Jan-2014 AFTA-WFIRST coronagraph instrument status report - ExoPAG Zhao, Feng
4-Jan-2014 Exoplanet direct imaging: coronagraph probe mission study "EXO-C" Stapelfeldt, Karl; Brenner, Michael
1-Jan-2014 Single-event effect report for EPC Series eGaN FETs: the effect of load conditions on destructive SEE Scheick, Leif
1-Jan-2014 Single-event effect report for EPC Series eGaN FETs: comparison of EPC1000 and EPC2000 series devices for destructive SEE Scheick, Leif
1-Jan-2014 Single-event effect report for EPC Series eGaN FETs: proton testing for SEE and TNID effects Scheick, Leif
1-Jan-2014 NEPP DDR device reliability FY13 report Guertin, Steven M.; Amrbar, Mehran
1-Jan-2014 Single event gate rupture characterization of the Fuji MOSFETs: 2SJ1A03 (A08P10), 2SJ1A09 (A08P20), and NSD1A01 Scheick, Leif
1-Jan-2014 Single-event effect report for EPC Series eGaN FETs: EPC2015, EPC2014, EPC2012 Scheick, Leif
1-Jan-2014 Investigation of the Semicoa 2N7616 and 2N7425 and the Microsemi 2N7480 for single-event gate rupture and single-event burnout Scheick, Leif
1-Jan-2014 Evaluation of magnetoresistive RAM for space applications Heidecker, Jason
30-Dec-2013 AFTA coronagraph results subsequent to down-select Gehrels, N.; Traub, W.; Krist, J.; Content, D.; Grady, K.; Blackwood, G.; Guyon, O.; Kasdin, J.; Macintosh, B.; Trauger, J.
16-Dec-2013 FSW is TWO systems, not one Burleigh, Scott
16-Dec-2013 Next generation flight computing: a joint investment of NASA and AFRL Doyle, Richard; Mounce, Gabriel; Avery, Keith; Powell, Wesley; Johnson, Michael; Some, Raphael; Gostelow, Kim; Lai, John; Bergman, Larry; Whitaker, William; Goforth, Montgomery
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